New Orbotech Solutions Enable Next-Gen Electronics
As 5G smartphones, advanced automotive electronics, medical and WFH/LFH (learn-from-home) devices become lighter in weight, smaller in form factor and...
Meet KLA Instruments
Earlier this year we launched KLA Instruments, bringing together many of our product lines in the surface metrology space. We...
New Packaging Products Drive Innovation
Enjoy the previously unreleased interviews with KLA’s engineering teams below! The original post follows. Today, KLA Corporation announced the launch...
A KlearView™ of All Reticle Data
Complex, high-volume semiconductor manufacturing processes require advanced optical and EUV reticles. These reticles must be error-free, as reticle defects or...
New Defect Inspection System for SiC, GaN Substrates
Today KLA Instruments announced the Candela<sup>®</sup> 8520 defect inspection system for power device applications. It is the successor to the ...
KLA Goes to Mars
In July 2020, NASA launched the Perseverance Mars rover. In addition to several new cutting-edge scientific instruments, Perseverance carries three...
Breakthrough e-Beam Defect Inspection System
Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to accelerate time-to-market for...
SPTS’s Synapse™ for AlN/AlScN Etch for BAW Filters
In this article, SPTS, A KLA Company, demonstrates how their Synapse ™ plasma system can provide significant advantages over Inductively...